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Process capability compares the output of an in-control process to the specification limits by using capability indices. The comparison is made by forming the ratio of the spread between the process specifications (the specification "width") to the spread of the process values, as measured by 6 process standard deviation units (the process "width"). Process Capability Indices | |||||||||||||||||||||
A process capability index uses both the process variability and the process specifications to determine whether the process is "capable" |
We are often required to compare the output of a stable process with
the process specifications and make a statement about how well the process
meets specification. To do this we compare the natural variability
of a stable process with the process specification limits.
A process where almost all the measurements fall inside the
specification limits is a capable process.
This can be represented pictorially
by the plot below:
There are several statistics that can be used to measure the capability of a process: Cp, Cpk, Cpm. Most capability indices estimates are valid only if the sample size used is 'large enough'. Large enough is generally thought to be about 50 independent data values. The Cp, Cpk, and Cpm statistics assume that the population of data values is normally distributed. Assuming a two-sided specification, if |
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Definitions of various process capability indices |
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Sample estimates of capability indices |
Sample estimators for these indices are given below.
(Estimators are indicated with a "hat" over them).
The estimator for Cpk can also be expressed as Cpk = Cp(1-k), where k is a scaled distance between the midpoint of the specification range, m, and the process mean, Denote the midpoint of the specification range by m = (USL+LSL)/2. The distance between the process mean, The estimator for the Cp index, adjusted by the k factor, is |
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Plot showing Cp for varying process widths |
To get an idea of the value of the Cp statistic for
varying process widths, consider the following plot
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Translating capability into "rejects" |
We have discussed the situation with two spec. limits, the USL and LSL. This is known as the bilateral or two-sided case. There are many cases where only the lower or upper specifications are used. Using one spec limit is called unilateral or one-sided. The corresponding capability indices are |
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One-sided specifications and the corresponding capability indices |
Cp = (Cpu + Cpl) /2.This can be represented pictorially by
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Confidence Limits For Capability Indices | |||||||||||||||||||||
Confidence intervals for indices |
Assuming normally distributed process data, the distribution of the
sample
100(1- |
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Confidence Intervals for Cpu and Cpl |
Approximate 100(1- |
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Confidence Interval for Cpk |
Zhang et al. (1990)
derived the exact variance for the estimator of
Cpk as well as an approximation for
large n. The reference paper is Zhang, Stenback and Wardrop (1990),
"Interval Estimation of the process capability index", Communications
in Statistics: Theory and Methods, 19(21), 4455-4470.
The variance is obtained as follows:
Let |
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Capability Index Example | |||||||||||||||||||||
An example |
For a certain process the USL = 20 and the LSL = 8. The observed
process average,
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What happens if the process is not approximately normally distributed? | |||||||||||||||||||||
What you can do with non-normal data |
The indices that we considered thus far are based on normality of the
process distribution. This poses a problem when the process distribution
is not normal. Without going into the specifics, we can list some
remedies.
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Sunday, February 9, 2014
Process Capability
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